Deformation Analysis of Forsterite Olivine Using Electron Channeling Contrast Imaging and Electron Backscatter Diffraction
نویسندگان
چکیده
منابع مشابه
Crystallographic preferred orientations analysis of quartz crystals in Psammite using electron backscatter diffraction,western Ireland
The present study investigates the crystal preferred orientation (CPO) of quartz crystals in psammitic rocks to ascertain the deformationmechanism using electron backscatter diffraction (EBSD) on quartz crystals from north of the Renvyle-Bofin Slide (RBS) nearLetterfrack in western Ireland. Complete crystallographic orientations were determined for several thousand individual quartz crystalsin ...
متن کاملAxial Channeling in Electron Diffraction
für Naturforschung in cooperation with the Max Planck Society for the Advancement of Science under a Creative Commons Attribution 4.0 International License. Dieses Werk wurde im Jahr 2013 vom Verlag Zeitschrift für Naturforschung in Zusammenarbeit mit der Max-Planck-Gesellschaft zur Förderung der Wissenschaften e.V. digitalisiert und unter folgender Lizenz veröffentlicht: Creative Commons Namen...
متن کاملcrystallographic preferred orientations analysis of quartz crystals in psammite using electron backscatter diffraction,western ireland
the present study investigates the crystal preferred orientation (cpo) of quartz crystals in psammitic rocks to ascertain the deformationmechanism using electron backscatter diffraction (ebsd) on quartz crystals from north of the renvyle-bofin slide (rbs) nearletterfrack in western ireland. complete crystallographic orientations were determined for several thousand individual quartz crystalsin ...
متن کاملElectron Channeling Contrast Imaging: Rapid Characterization of Semiconductors
For semiconductor technologies, achievement of their ultimate potential depends greatly upon the ability to fully harness and exploit their advanced properties, which in turn depends on understanding these properties and their limiters. As such, the detailed characterization and analysis of advanced semiconductor materials and structures is paramount for the elucidation of these fundamental str...
متن کاملDirect detection of electron backscatter diffraction patterns.
We report the first use of direct detection for recording electron backscatter diffraction patterns. We demonstrate the following advantages of direct detection: the resolution in the patterns is such that higher order features are visible; patterns can be recorded at beam energies below those at which conventional detectors usefully operate; high precision in cross-correlation based pattern sh...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: Microscopy and Microanalysis
سال: 2016
ISSN: 1431-9276,1435-8115
DOI: 10.1017/s1431927616009806